Boundary Scan Archives | Page 4 of 10

At-Scale Test

Alan Sguigna

April 30, 2017
1:32 pm

Now that At-Scale Debug (ASD) is becoming a de facto standard on Intel designs for the remote execution of CScripts, what other applications can take advantage of this technology?

ASSET and CCI collaborate on integrated test solutions

Alan Sguigna

January 17, 2017
8:10 pm

Combining boundary-scan structural test with functional test is a “best practice” approach to high test coverage at least cost. So, it only makes sense that ASSET collaborates with Circuit Check.

ASSET’s Michael Johnson presented an update on Non-intrusive Board Test (NBT) at the 13th Annual Board Test Workshop (BTW) in Fort Collins, CO this past week. The overall question posed at the Workshop was, “Is Board Test Losing Relevance”?

Boundary-Scan Test on the TI MSP430

Alan Sguigna

September 5, 2016
1:53 pm

The MSP430 is a mixed-signal microcontroller family from Texas Instruments. Built around a 16-bit CPU, the MSP430 is designed for low cost, low power consumption embedded applications. But, does it support boundary scan for board test purposes?

Using Boundary-Scan Test at Debug & Repair Stations

Alan Sguigna

August 14, 2016
3:06 pm

Is it possible to use JTAG at debug & repair depots to reduce the cost of diagnosing bad boards?

JTAG and IJTAG-based Fast Flash Programming Algorithms

Alan Sguigna

March 20, 2016
5:11 pm

In recent years, the increasing size of flash memory has driven device programming to offline methods. However, new techniques are significantly reducing in-system programming times, making it much more feasible and convenient to program flash memory after it’s already been soldered to the board.

High Availability within Software-Defined Networks

Alan Sguigna

September 27, 2015
5:48 pm

As network functions become virtualized and proprietary hardware migrates to commodity Intel-based servers, will Carrier service levels degrade?

JTAG|DDR4 Connectivity Test Mode (JESD79-4)

Kent Zetterberg

September 22, 2015
2:45 pm

Recently launched DDR4 devices have what memory device vendors may refer to as a “boundary scan” test mode. Even though there’s not really a boundary-scan function involved on the DDR4 side, this mode actually has been, as claimed by JEDEC, “designed to work seamlessly with any boundary-scan devices.” Here’s a brief introduction to what it does and how to test it with a boundary-scan (JTAG) tool.

JTAG Boundary-Scan Test for the Intel Innovation Engine

Alan Sguigna

September 13, 2015
3:23 pm

As described in earlier blogs, the new Intel Innovation Engine (IE) makes an ideal host for validation, debug, trace and test applications on Intel platforms. This article details the implementation of a JTAG execution engine on the IE for the purposes of printed circuit board structural and functional testing.

Using the Intel Innovation Engine for Embedded DDR4 Memory Test

Alan Sguigna

September 7, 2015
3:28 pm

Last week, I wrote about Intel’s public announcement of the Innovation Engine (IE), an Intel architecture processor and I/O sub-system embedded into their upcoming generations of server platforms. This article describes the use of the IE for JTAG boundary-scan testing of memories.

Category: Boundary Scan

At-Scale Test

ASSET and CCI collaborate on integrated test solutions

NBT at the BTW

Boundary-Scan Test on the TI MSP430

Using Boundary-Scan Test at Debug & Repair Stations

JTAG and IJTAG-based Fast Flash Programming Algorithms

High Availability within Software-Defined Networks

JTAG|DDR4 Connectivity Test Mode (JESD79-4)

JTAG Boundary-Scan Test for the Intel Innovation Engine

Using the Intel Innovation Engine for Embedded DDR4 Memory Test

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