Category: Boundary Scan

Unboxing Boundary-Scan Test

Alan Sguigna

December 16, 2018
8:26 pm

I’ve gotten all of my Christmas shopping done early, so I managed to make some time for exploring our ScanWorks test tool. I’m taking a “newbie approach” to using the tool, initially for hacking around with boundary-scan test. There’s some pretty cool technology here.

Testing DDR4 Memory with Boundary Scan/JTAG

Michael Johnson

December 5, 2018
2:28 pm

Using U-boot as production test strategy — really?

Larry Osborn

November 1, 2018
9:53 am

Increase your Memory and Device Test Coverage by Example with the UltraZed Board.

Larry Osborn

October 16, 2018
11:56 am

Optimize your DDR3 tuning in the i.MX 6Quad with less frustration

Larry Osborn

September 11, 2018
11:02 am

Master DDR3 tuning on Zynq-7000 with less technical reference manual (TRM) stress

Larry Osborn

August 14, 2018
2:45 pm

PFx support for the NXP SABRE Lite design for rapid startup

Larry Osborn

June 26, 2018
10:22 am

Rapid deployment for Xilinx Zynq-7000 just got a little easier

Larry Osborn

June 21, 2018
8:20 am

New embedded test technology enables improved DDR and IO testing plus fast flash programming

Larry Osborn

June 13, 2018
12:17 pm

Embedded JTAG for Built-In Self Test

Alan Sguigna

April 8, 2018
9:01 pm

Embedding JTAG into a system’s service processor allows for powerful out-of-band (independent of the operating system) built-in self test (BIST) functions. Using JTAG-based boundary scan, for example, can isolate system failure root cause to an extent unachievable through any other means.

Category: Boundary Scan

Unboxing Boundary-Scan Test

Testing DDR4 Memory with Boundary Scan/JTAG

Using U-boot as production test strategy — really?

Increase your Memory and Device Test Coverage by Example with the UltraZed Board.

Optimize your DDR3 tuning in the i.MX 6Quad with less frustration

Master DDR3 tuning on Zynq-7000 with less technical reference manual (TRM) stress

PFx support for the NXP SABRE Lite design for rapid startup

Rapid deployment for Xilinx Zynq-7000 just got a little easier

New embedded test technology enables improved DDR and IO testing plus fast flash programming

Embedded JTAG for Built-In Self Test

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