ScanWorks Processor-based Functional Test for DDR provides the fastest means in assisting designers with optimal DDR configurations and shortening the test development cycle, thus keeping projects on schedule. Like the other members of the ScanWorks PFx family (Processor-based Fast Programming, Processor-based Functional Test) Processor-based Functional Test for DRR uses the core portion, CPU and OCM (On Chip Memory), of the SoC as the target for the controlling agent. This firmware will lessen the knowledge burden for DDR calibration, tuning, and functional test development. It provides everything needed for a fast and comprehensive solution for configuration and testing of all DDR memory. The memory tests include:
- Walking 0’s and 1’s
- Address Line Test
- Data Bus Noise Test
- Memory Cell Test
- At-speed Testing
- Address March Test
- Burst Transfer Test
- Performance Tests
- Simultaneous Switching Output Test
This firmware has no need of an operating system or boot loader, thus is perfect for early prototype board development. ScanWorks Processor-based Functional Test for DDR is designed to enable time savings in development and to increase product quality for Arm Cortex based SoC’s from Xilinx and NXP. Arm-based SoCs provide a powerful platform for product development in many market segments such as Defense, Automotive, Embedded Vision, IoT and IIoT. The common thread in all these markets is developing with DDR memories.