Real Insight from Code to Silicon
Structural defects need to be identified quickly so they can be repaired, and processes can be adjusted. This eBook covers more advanced guidelines for board design for test (DFT) based on Boundary Scan and focuses on structural memory tests, flash programming, and FPGA configuration.
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Here’s your chance to see how easy it is to debug and test using SourcePoint or ScanWorks. Let us walk you through it!