Real Insight from Code to Silicon
The ability to thoroughly test, characterize and diagnose faults and failures with soldered-down memory is one of the most pressing problems in the industry. With ASSET InterTech’s ScanWorks® Boundary-Scan Test, engineers designing with Double Data Rate 4 (DDR4) memory devices can facilitate shorts and opens testing on control, address, and data lines.
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Webinar: Chiplet interconnect testing using JTAG/boundary scan
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Here’s your chance to see how easy it is to debug and test using SourcePoint or ScanWorks. Let us walk you through it!