Category: Boundary Scan

Board bring-up is a phased process whereby an electronics system is repeatedly tested, validated and debugged, in order to achieve readiness for manufacture. This process can take so long that a product never gets to market because it is succeeded by the next generation...
Programming NOR or large NAND flash devices can be done using a variety of technologies, including boundary scan (JTAG), processor-controlled test (emulation), or FPGA-controlled test. Which embedded instrument you use is a trade-off between speed, complexity and cost.
I was reflecting on how much processor speeds, memory, and data transmission rates have increased over the last few decades. And yet the same old tools and techniques are often used to bring up new designs. When do you think we fall off the cliff?
Ever heard the old saw about the guy (gal) that “went to a fight and a hockey game broke out”? I’d characterize the ongoing debate on the value and longevity of In-Circuit Test (ICT) as a bit of a brawl…
Board bring up of an early prototype is one of the most important steps for a design team. The first boards must pass through a battery of tests to demonstrate that the hardware is rock-solid. Non-intrusive technologies can be used to accelerate this process.
Tired of that old bed-of-nails? Legacy In-Circuit Test (ICT) has been diminishing in value for a long time. Let’s explore some of the current technical issues with ICT as test access on new circuit board designs continues to disappear.