Category: High-Speed I/O

We announced today the extended integration of ScanWorks’ boundary-scan test capabilities with the Teradyne’s PXI Express-based High Speed Subsystem (HSSub). Come see a demo at Booth #101 at the AUTOTESTCON conference!
Now that At-Scale Debug (ASD) is becoming a de facto standard on Intel designs for the remote execution of CScripts, what other applications can take advantage of this technology?
It is often part of a hardware validation test suite to initiate multiple PCIe bus retrains, looking for hardware design issues, or LTSSM RTL bugs in the device under test. These test suites take a very long time to run. Is there a way to speed them up?