Latent structural faults may be undetectable by traditional functional test, manifesting themselves via system failures in the field, which is unacceptable for mission-critical applications. This dictates a new approach to built-in test: using JTAG-based boundary-scan test (BST) within system firmware, thereby eliminating the need for external physical hardware probes, and providing an in-situ mechanism for failure prevention and proactive maintenance.
This webinar, to be held on Wednesday, May 19, 2021 at 10:30am CT, describes the application of JTAG for Built-In Self Test, the technology behind it, Test Access Port (TAP) controller firmware requirements, the BST library Application Program Interface (API), and hardware design requirements.
Register here: Embedded JTAG/boundary scan for Built-In Self Test
If you can’t attend the webinar, go ahead and register, and we’ll send you a link with the recording afterwards.