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Adaptive Equalization, or “The Math is in the Chip”

Alan Sguigna

November 2, 2012
12:38 pm

Modern high-speed I/O equalization schemes typically include both fixed (programmable) and adaptive components to ensure signal integrity even in adverse system conditions. What tools are available to ensure that these equalization techniques are working properly on a given system?

Single-bit Memory Errors

Alan Sguigna

October 24, 2012
4:23 pm

Ever wonder if a stray cosmic ray or alpha particle might double your bank account, due to an undetected RAM error?

Oscilloscopes versus Embedded Instruments

Alan Sguigna

October 7, 2012
8:33 pm

What’s cheaper, faster, and more powerful than an oscilloscope, when it comes to validating high-speed signal integrity? Why, a software application using embedded instruments, of course. How is this possible?

Testing Intel Sandy Bridge and Ivy Bridge

Alan Sguigna

September 30, 2012
2:24 pm

In my last few blogs, I’ve talked about the challenges of testing QPI, PCI Express, SATA 3, and DDR3 memory. These buses are common to many Intel Sandy Bridge and Ivy Bridge motherboard designs. Should test engineers take chances and just not test them?

Problems with Powered Opens on ICT

Alan Sguigna

September 16, 2012
1:45 pm

If you’re using Powered Opens on In-Circuit Test, you may not be getting the test coverage you expect.

Testing SATA 3

Alan Sguigna

September 9, 2012
2:27 pm

Serial ATA 3 (SATA 3, or SATA III) is a differential bus running at 6Gbps. It’s commonly used on computer motherboards, such as notebooks, to connect to mass storage devices. How do you know if your hard disk or flash drive is running at full speed?

Is there a market for on-chip instrumentation?

Alan Sguigna

September 3, 2012
1:42 pm

Brian Bailey, editor of EETimes’ EDA Designline, recently penned a blog questioning the ubiquity and value of embedded instrumentation within chips. It’s a fascinating and timely read, and I’d like to put my two cents worth in…

Be an expert where it matters most to your customer

Larry Osborn

August 30, 2012
9:26 am

When you come right down to it, we spend too many days/nights, weeks and weekends writing code for device configuration, production test and system test. The question I’d like to raise is: What is the value of these home grown tests? Do they provide intrinsic and tangible value to your end customer?

Testing Intel QuickPath Interconnect

Alan Sguigna

August 26, 2012
3:11 pm

Last week I published a blog on detecting defects on PCI Express. Does Intel QuickPath Interconnect (QPI) differ in any way?

Testing PCI Express

Alan Sguigna

August 16, 2012
8:16 pm

PCI Express (PCIe) buses, in particularly Gen3, are susceptible to defects which may be masked from conventional test. What are these defects and how are they detected?

Adaptive Equalization, or “The Math is in the Chip”

Single-bit Memory Errors

Oscilloscopes versus Embedded Instruments

Testing Intel Sandy Bridge and Ivy Bridge

Problems with Powered Opens on ICT

Testing SATA 3

Is there a market for on-chip instrumentation?

Be an expert where it matters most to your customer

Testing Intel QuickPath Interconnect

Testing PCI Express

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