Are you investing new capital on an old test strategy that is centered around in-circuit test but getting less of a return on that money? Much has changed in the decades since ICT was introduced. These changes are covered in Adam Ley's e-Book: Solving the Problems of Diminishing Test Coverage from In-Circuit Test (ICT). While test access and test coverage at ICT are diminishing, new standards and techniques continue to emerge to fill the void.
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