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Moving run-control (Intel In-Target Probe, or ITP) down into the service processor on an x86 design results in a screamingly fast, scalable implementation of at-scale debug. This article contains some timing benchmarks of our embedded solution versus alternatives. The results are nothing short of astonishing.
Embedding JTAG into a system’s service processor allows for powerful out-of-band (independent of the operating system) built-in self test (BIST) functions. Using JTAG-based boundary scan, for example, can isolate system failure root cause to an extent unachievable through any other means.
For those who may have missed it, I've been blogging about my experiences with the MinnowBoard Turbot for the last 15 months. Now, finally, all the blogs have been combined into a 138-page compendium of my learnings about x86 architecture, UEFI, Yocto Linux, and many other technical topics. Check it out at The MinnowBoard Chronicles (note: requires registration). 
High-end, mission-critical systems often use a plethora of diagnostic routines for power-on self test (POST), data logging, operational measurements, Built-In Self Test (BIST), and platform audits. Embedded x86 JTAG run-control adds out-of-band services to this mix. This article describes one such use case for Power-On Self Test (POST) of PCI Express ports.
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