Blog

Defects on High-Speed Memory – Part 2

Alan Sguigna

May 19, 2013
8:37 pm

Last month, we saw how defects on memory data lines can cause a system to fail, and yet escape detection by the system boot loader or BIOS. Let’s examine this in more technical detail.

High-Speed Non-Intrusive Board Test | PCIe, QPI

Johan Renberg

May 16, 2013
10:58 am

Functional testing of I2C and SPI system monitors with JTAG

Kent Zetterberg

May 8, 2013
2:02 pm

SIV versus SMV – Part 2

Alan Sguigna

May 5, 2013
12:06 pm

Last week we saw a $300,000 oscilloscope. This week, we look at another one for $470,000. The sky’s the limit when it comes budgeting for ‘scopes. But aside from the price, what other advantages are there of embedded instrumentation-based system marginality validation tools?

Defect Coverage | Non-intrusive Board Test eBook

Johan Renberg

April 30, 2013
11:59 am

PXI meets embedded instrumentation

Kent Zetterberg

April 23, 2013
4:23 pm

Signal Integrity Validation (SIV) versus System Marginality Validation (SMV)

Alan Sguigna

April 23, 2013
1:57 pm

Back a few years ago, engineers used expensive high-end oscilloscopes to perform signal integrity validation (SIV) on their designs, and considered that adequate in determining the success of a design. But with today’s products, process and parameter variations occur that require system marginality validation (SMV) to be done by less expensive software-based tools, to determine if a design is ready for high volume production.

Defects on High-Speed Memory

Alan Sguigna

April 7, 2013
12:00 pm

In previous blogs we covered the kind of defects that might exist on high-speed serial I/O and their associated impacts on system performance and stability. A similar analysis on DDR SDRAM yields some interesting findings.

SVF | Serial Vector Format Specification | JTAG | Boundary Scan

Arden Bjerkeli

April 2, 2013
4:59 pm

Structural Defects on High-Speed Serial I/O – Part 3

Alan Sguigna

March 31, 2013
1:51 pm

In the first two parts of this multi-part blog, we reviewed different kinds of short circuit, open circuit, and stuck-at faults and how they might affect link performance. Let’s recap and rank these defects and see what we can do about them.

Defects on High-Speed Memory – Part 2

High-Speed Non-Intrusive Board Test | PCIe, QPI

Functional testing of I2C and SPI system monitors with JTAG

SIV versus SMV – Part 2

Defect Coverage | Non-intrusive Board Test eBook

PXI meets embedded instrumentation

Signal Integrity Validation (SIV) versus System Marginality Validation (SMV)

Defects on High-Speed Memory

SVF | Serial Vector Format Specification | JTAG | Boundary Scan

Structural Defects on High-Speed Serial I/O – Part 3

Archives

Categories