Blog

As described in earlier blogs, the new Intel Innovation Engine (IE) makes an ideal host for validation, debug, trace and test applications on Intel platforms. This article details the implementation of a JTAG execution engine on the IE for the purposes of printed circuit board structural and functional testing.
Last week, I wrote about Intelโ€™s public announcement of the Innovation Engine (IE), an Intel architecture processor and I/O sub-system embedded into their upcoming generations of server platforms. This article describes the use of the IE for JTAG boundary-scan testing of memories.
In my last blog, I reviewed the difference between Run-Control and Trace, as two powerful debugging technologies. How are they used together to dramatically improve the chances of catching an intermittent bug?
Boundary-scan test is used commonly on manufacturing lines with a โ€œbenchtopโ€ tester, complete with cables, fixturing, hardware probes, and so on. What are the pros and cons of embedding this technology in-situ?
Intelยฎ provides a collection of scripts (collectively known as Intelยฎ Customer Scripts, or CScripts for short), which assist customers with platform debug and validation. Can they be made to run faster?
Archives