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Category: Industry Standards and Forums

NBT at the BTW

Alan Sguigna
Alan Sguigna
  • 4:12 pm
ASSET’s Michael Johnson presented an update on Non-intrusive Board Test (NBT) at the 13th Annual Board Test Workshop (BTW) in Fort Collins, CO this past week. The overall question posed at the Workshop was, “Is Board Test Losing Relevance”?

Boundary-Scan Test on the TI MSP430

Alan Sguigna
Alan Sguigna
  • 1:53 pm
The MSP430 is a mixed-signal microcontroller family from Texas Instruments. Built around a 16-bit CPU, the MSP430 is designed for low cost, low power consumption embedded applications. But, does it support boundary scan for board test purposes?

ASSET Joins the UEFI Forum

Alan Sguigna
Alan Sguigna
  • 4:04 pm
As the UEFI Forum continues to make advances in the technology behind what is still called the BIOS (Basic Input/Output System), ASSET has joined this standards body to assist in the debug of its latest features.

JTAG|DDR4 Connectivity Test Mode (JESD79-4)

Kent Zetterberg
Kent Zetterberg
  • 2:45 pm
Recently launched DDR4 devices have what memory device vendors may refer to as a “boundary scan” test mode. Even though there’s not really a boundary-scan function involved on the DDR4 side, this mode actually has been, as claimed by JEDEC, “designed to work seamlessly with any boundary-scan devices.” Here’s a brief introduction to what it does and how to test it with a boundary-scan (JTAG) tool.
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