Category: Industry Standards and Forums

Programming NOR or large NAND flash devices can be done using a variety of technologies, including boundary scan (JTAG), processor-controlled test (emulation), or FPGA-controlled test. Which embedded instrument you use is a trade-off between speed, complexity and cost.
The new Sandy Bridge E (Enthusiast) processors are a gamer’s delight. With the new LGA2011 socket and X79 chipset, Intel Sandy Bridge-E series processors come with enhanced performance overclocking support. But is it worth the money?
OEMs in the telecom industry invest in verifying the performance and conformance of the high-speed interconnects off their gear. Does the same approach apply to chip-to-chip interconnects, and in other industries?
Ever heard the old saw about the guy (gal) that “went to a fight and a hockey game broke out”? I’d characterize the ongoing debate on the value and longevity of In-Circuit Test (ICT) as a bit of a brawl…
Although it has been in the news for quite a while, one of the methods thought to be the way to extend Moore’s Law is finally reaching the point where it may be deployed in the near future — 3D Silicon Integration…
One of the newest IEEE Standards Committees is currently defining the P1838 3D Test Standard. The main goal of P1838 is to develop a “Per Die” Access Mechanism that becomes a “Stacked Die” Access Mechanism when the individual die are stacked into 3D silicon. Find out more…
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