Category: Intel® IBIST

Serial ATA (SATA)-based systems come in a wide range of topologies and trace/cable lengths. This presents signal integrity challenges due to signal loss, reflection and crosstalk; causing SATA device detection problems, lack of interoperability, slower performance, and increased radio frequency interference. What are the main issues, and how do designers mitigate them?
Determining the margins of a system requires taking a statistically large-enough data collection sample size to achieve a meaningful result. The sample size takes into account variances due to silicon process, temperature, voltage, finite test time, and a number of other factors. What is the math behind this?
We know that the board bring-up process can be extremely challenging on today’s complex, high-speed designs. How do we get the iterative validation, test and debug steps off of the critical path of new product introduction?
To quote Ransom Stephens in the DesignCon Community Blog, “BIST (Built-In System Test), is an acronym that would keep executives at test-and-measurement companies awake at night, if they knew what it meant.” What’s he talking about?