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Category: Embedded Diagnostics

Remote Application of Intel CScripts

Alan Sguigna
Alan Sguigna
  • 5:00 pm
Intel CScripts are very valuable for debug and validation of everything from smartphones to servers. They acquire even more power when they can be applied remotely.

JTAG Boundary-Scan Test for the Intel Innovation Engine

Alan Sguigna
Alan Sguigna
  • 3:23 pm
As described in earlier blogs, the new Intel Innovation Engine (IE) makes an ideal host for validation, debug, trace and test applications on Intel platforms. This article details the implementation of a JTAG execution engine on the IE for the purposes of printed circuit board structural and functional testing.

Using the Intel Innovation Engine for Embedded DDR4 Memory Test

Alan Sguigna
Alan Sguigna
  • 3:28 pm
Last week, I wrote about Intel’s public announcement of the Innovation Engine (IE), an Intel architecture processor and I/O sub-system embedded into their upcoming generations of server platforms. This article describes the use of the IE for JTAG boundary-scan testing of memories.

Embedded Boundary-Scan Test

Alan Sguigna
Alan Sguigna
  • 6:09 pm
Boundary-scan test is used commonly on manufacturing lines with a “benchtop” tester, complete with cables, fixturing, hardware probes, and so on. What are the pros and cons of embedding this technology in-situ?

Embedded ITP for Remote Debug

Alan Sguigna
Alan Sguigna
  • 3:30 pm
A leading server OEM is using an embedded implementation of Intel In-Target Probe (ITP) to perform at-scale debugging, without plugging in an external emulator. How does this work?

Debugging CATERR in field systems

Alan Sguigna
Alan Sguigna
  • 4:46 pm
Let’s say you wanted to debug a CATERR on an Intel x86-based system out in the field. And let’s say that the CATERR only happened in a given datacenter once a week. An embedded implementation of the In-Target Probe (ITP) would help.

Software Debug in Environmental Chambers

Alan Sguigna
Alan Sguigna
  • 4:28 pm
Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS) are often used to detect faults in electronic systems, testing the extremes and determining the outer limits of system margins. All hardware components and systems will eventually fail under environmental stress. But can this technique be used to improve software reliability as well?
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