Category: Embedded Diagnostics

In a previous blog, I shared some prospective information on the real-time performance of Intel CScripts, when run on our SourcePoint debugger, versus legacy methods. This article contains quantitative measurements, and supports the theory that SourcePoint yields much higher throughput.
Intel CScripts are very valuable for debug and validation of everything from smartphones to servers. They acquire even more power when they can be applied remotely.
As described in earlier blogs, the new Intel Innovation Engine (IE) makes an ideal host for validation, debug, trace and test applications on Intel platforms. This article details the implementation of a JTAG execution engine on the IE for the purposes of printed circuit board structural and functional testing.
Last week, I wrote about Intel’s public announcement of the Innovation Engine (IE), an Intel architecture processor and I/O sub-system embedded into their upcoming generations of server platforms. This article describes the use of the IE for JTAG boundary-scan testing of memories.
Boundary-scan test is used commonly on manufacturing lines with a “benchtop” tester, complete with cables, fixturing, hardware probes, and so on. What are the pros and cons of embedding this technology in-situ?
A leading server OEM is using an embedded implementation of Intel In-Target Probe (ITP) to perform at-scale debugging, without plugging in an external emulator. How does this work?