Category: Embedded Diagnostics

Boundary-scan test is used commonly on manufacturing lines with a “benchtop” tester, complete with cables, fixturing, hardware probes, and so on. What are the pros and cons of embedding this technology in-situ?
A leading server OEM is using an embedded implementation of Intel In-Target Probe (ITP) to perform at-scale debugging, without plugging in an external emulator. How does this work?
Let’s say you wanted to debug a CATERR on an Intel x86-based system out in the field. And let’s say that the CATERR only happened in a given datacenter once a week. An embedded implementation of the In-Target Probe (ITP) would help.
Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS) are often used to detect faults in electronic systems, testing the extremes and determining the outer limits of system margins. All hardware components and systems will eventually fail under environmental stress. But can this technique be used to improve software reliability as well?
Last month, we saw how defects on memory data lines can cause a system to fail, and yet escape detection by the system boot loader or BIOS. Let’s examine this in more technical detail.
Embedded run-control (aka on-chip debug, or processor debug port control) has numerous benefits in the areas of test and debug, for Design Engineering, Manufacturing Test Engineering, and Field Service. What are they?
Board bring-up is a phased process whereby an electronics system is repeatedly tested, validated and debugged, in order to achieve readiness for manufacture. This process can take so long that a product never gets to market because it is succeeded by the next generation...
I was reflecting on how much processor speeds, memory, and data transmission rates have increased over the last few decades. And yet the same old tools and techniques are often used to bring up new designs. When do you think we fall off the cliff?