The most common questions we field about the IEEE P1687 IJTAG (Internal JTAG) standard for embedded instrumentation are: “Is anyone using P1687? Does it have real and practical applications?” The answer to these questions is an emphatic YES!
Boundary scan is known to be quite slow to program large flash devices. But, with a new approach using SPI Master IP within an FPGA, flash programming time can be decreased by a factor of 15 or more.
To quote Ransom Stephens in the DesignCon Community Blog, “BIST (Built-In System Test), is an acronym that would keep executives at test-and-measurement companies awake at night, if they knew what it meant.” What’s he talking about?
