Category: IJTAG

Boundary scan is known to be quite slow to program large flash devices. But, with a new approach using SPI Master IP within an FPGA, flash programming time can be decreased by a factor of 15 or more.
To quote Ransom Stephens in the DesignCon Community Blog, “BIST (Built-In System Test), is an acronym that would keep executives at test-and-measurement companies awake at night, if they knew what it meant.” What’s he talking about?