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IEEE P1687 and In-Circuit Test (ICT)

Alan Sguigna

June 5, 2011
9:43 am

Run IEEE P1687-based tests at ICT? I don't think so...

The test stack

Alan Sguigna

February 20, 2011
9:20 am

Those of you with a telecom background are no doubt aware of the “OSI Network Model”, also known as the OSI pyramid or stack. It is a way of sub-dividing a communications system into smaller parts called layers. A layer is a collection of similar functions that provide services to the layer above it and receives services from the layer below it. A decade ago, the telecommunications test industry underwent a revolution when platforms emerged that could cover multiple layers of the OSI stack. Now, the same thing is happening in the circuit board test industry...

Test coverage using multiple technologies

Alan Sguigna

January 10, 2011
9:17 pm

It is a well-known fact that manufacturing test strategies must involve a combination of inspection, structural, and functional test technologies in order to yield highest quality and minimize customer returns. But a new breed of non-intrusive, software-based technologies promises to disrupt legacy test solutions by guaranteeing the highest test coverage at the lowest cost. These technologies leverage off of the embedded instruments within silicon to achieve this goal in the following ways...

A week at ITC

Alan Sguigna

November 12, 2010
5:26 am

Last week, ASSET unveiled the first toolkit for IEEE 1687 at the International Test Conference (ITC) in Austin, TX. ITC is the cornerstone of “Test Week”, a premiere technical event which addresses the challenges of providing high-quality, cost-effective test solutions for chips, boards and systems...

Who will use IEEE 1687?

Larry Osborn

September 14, 2010
4:38 am

The IEEE 1687 standard resonates with engineers and managers, no matter which part of the semiconductor-based product lifecycle they are involved with, because it either solves a technical problem, it provides a cost advantage, it reduces the amount of work, or it enables automation of some (onerous) task…

What is IEEE 1687?

Michael Johnson

August 20, 2010
6:43 pm

This is the first of a series of blogs answering the question, “what is IEEE 1687”. Subsequent blogs will cover the topics “who uses IEEE 1687”, “what are the advantages of using IEEE 1687 (why use IEEE 1687)”, and “how to use IEEE 1687.”

iNEMI Built-In Self-Test Project Wrap-Up

Alan Sguigna

July 21, 2010
12:46 pm

Last week iNEMI (the International Electronics Manufacturing Initiative) concluded its nine-month project investigating Built-In Self-Test (BIST). The purpose of the iNEMI Project was to develop and promote the adoption of chip BIST at the board and system level. Here's a summary of the conclusions...

IEEE 1149.7 & 1687 – dispelling the misconceptions

Larry Osborn

July 6, 2010
12:57 pm

When the subject of new standards comes up, the reaction of some may be a roll of the eyes and the question: Tell me again why we need another new standard? At least with two new IEEE standards, 1149.7 and P1687, it’s clear that there’s tremendous value in the technology they enable. Still, there are some misconceptions afoot that ought to be dispelled...

Category: IJTAG

IEEE P1687 and In-Circuit Test (ICT)

The test stack

Test coverage using multiple technologies

A week at ITC

Who will use IEEE 1687?

What is IEEE 1687?

iNEMI Built-In Self-Test Project Wrap-Up

IEEE 1149.7 & 1687 – dispelling the misconceptions

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