Press Releases Archive | Page 8 of 11

ASSET's two new embedded instruments test memory from a board-tester-in-a-chip

Tuesday, August 7, 2012

Instruments for ScanWorks FPGA-controlled test (FCT) perform DDR2, DDR3 and generic memory tests at maximum speeds Richardson, TX (August 7, 2012) – ASSET® InterTech has added two new memory test instruments to its ScanWorks® embedded instrumentation library for its FPGA-controlled test (FCT) circuit board test tool, giving electronics manufacturers…

ASSET's two new ScanWorks controller kits tap into high-speed PCI Express bus

Thursday, May 17, 2012

New PCIe-1000 and PCIe-410 are platform controllers supporting ScanWorks® validation, test and debug tools. Richardson, TX – Two new controller kits for the ScanWorks® platform for embedded instruments from ASSET® InterTech (www.asset-intertech.com) can accelerate test throughput by plugging into the high-speed PCI Express® (PCIe) bus in the personal computer…

ASSET's board bring-up solution first to validate, test and debug designs using the Intel microarchitecture codenamed Haswell

Thursday, April 12, 2012

ScanWorks platform offers design engineers a comprehensive tool suite for hardware, firmware and software testing and verification. Richardson, TX – With new tools for the ASSET® ScanWorks® platform for embedded instruments, design engineers can for the first time structurally verify, functionally test, analyze performance margins and debug boards based…

ASSET ScanWorks FCT named to EDN magazine's Hot 100 Products list

Tuesday, November 29, 2011

Editors at EDN chose ScanWorks from among thousands of new products released during 2011 Richardson, TX – ASSET® InterTech’s ScanWorks® FPGA-controlled test (FCT) has been named to the Hot 100 Products list by the editors of EDN magazine, an authoritative publication and web site serving the electronics industry. ASSET…

Four products within the ASSET ScanWorks platform for embedded instruments are named Best in Test finalists

Tuesday, November 15, 2011

Richardson, TX (Nov. 15, 2011) – Four new products for ASSET® InterTech's ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World magazine for its 2012 Best in Test awards. ASSET (www.asset-intertech.com) is the leading supplier of tools for embedded instrumentation. "It always a tremendous…

ASSET's new Ethernet controller for ScanWorks tests four circuit boards at once

Tuesday, November 1, 2011

Richardson, TX – The new Remote Instrumentation Controller 4000 (RIC-4000) for ASSET®’s ScanWorks® platform for embedded instruments can connect over an Ethernet network and apply boundary scan (JTAG) tests on as many as four circuit boards at once. The units under test (UUT) and ScanWorks could be in the…

ASSET's new FPGA-controlled test (FCT) inserts and operates a board-tester-in-a-chip

Tuesday, September 20, 2011

ScanWorks automatically connects multiple instruments and inserts a tester in an FPGA to validate, test or debug the host circuit board. Richardson, TX – With new tools for the ASSET® ScanWorks® platform for embedded instruments engineers can simply select instruments they need, set their parameters and insert them into…

ASSET integrates ScanWorks with Teradyne Di-Series instruments for robust boundary-scan test

Tuesday, September 13, 2011

Teradyne and ASSET collaborate to bring boundary-scan board test and device programming to large scale military/aerospace testers. Richardson, TX, and North Reading, MA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Teradyne (www.teradyne.com), the leading supplier of automatic test equipment (ATE), have collaborated to…

ASSET ScanWorks is first to offer validation tools for new Intel® microarchitecture codenamed Haswell

Tuesday, September 13, 2011

New ScanWorks tools will validate all high speed I/O buses on circuit boards with the Intel microarchitecture codenamed Haswell Richardson, TX – When circuit board designs for desktop and mobile applications roll out with Intel® Core™ processors based on the new Intel microarchitecture codenamed Haswell, ASSET®’s ScanWorks® platform for…

ASSET's new modeling methodology extends non-intrusive JTAG/boundary-scan test coverage

Thursday, September 8, 2011

Richardson, TX& – A new model-based test methodology for ASSET® InterTech’s ScanWorks® platform for embedded instruments extends non-intrusive boundary-scan (JTAG) test coverage to devices that previously could not be tested or programmed with boundary scan. ASSET is the leading supplier of tools for embedded instrumentation. With the new modeling…

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