Press Releases

A new eBook from ASSET explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during circuit board production. Devices such as temperature sensors, electrical sensors and…

With the new PXI-based controller for ASSET® InterTech’s ScanWorks® platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different test technology. Operating from a personal computer and a PXI chassis, the new ScanWorks PXI-1000 controller can apply boundary-scan tests…

Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the…

Linear Technology and ASSET collaborate to bring boundary-scan tools to power management devices  Richardson, TX, and Milpitas, CA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Linear Technology Corp. (www.linear.com) have collaborated to combine the programming and configuration capabilities of Linear Technology’s LTpowerPlay™ software with…