Press Releases Archive | Page 7 of 11

New PXI controller for ASSET’s ScanWorks platform supports four test technologies

Tuesday, April 23, 2013

With the new PXI-based controller for ASSET® InterTech’s ScanWorks® platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different test technology. Operating from a personal computer and a PXI chassis, the new ScanWorks PXI-1000 controller can apply boundary-scan tests…

ASSET enhances IJTAG embedded instrumentation tool for debugging systems-on-a-chip (SoC) and testing circuit boards

Wednesday, March 27, 2013

Improvements to the graphical viewer and significantly faster performance are among the enhancements to ASSET® InterTech’s ScanWorks® IJTAG Test tool, with which engineers are able to access, control and automate the operations of test and measurement instruments embedded in chips. ScanWorks IJTAG Test was the first suite of tools…

New eBook explores CPU cache-as-RAM for board bring-up of non-booting prototype circuit boards

Tuesday, February 26, 2013

A new eBook from ASSET® InterTech, the leading supplier of tools for embedded instrumentation, takes a close look at how run-control tools can employ a processor’s on-chip cache memory instead of on-board RAM memory to boot non-booting prototype circuit boards. “Designers often face a catch-22. They have to diagnose a…

New eBook explores how manufacturing process variances affect throughput on high-speed serdes

Tuesday, February 12, 2013

Richardson, TX (February 12, 2013) – High-speed serdes (serializer/deserializer) links on printed circuit boards (PCB) sometimes don’t achieve their expected throughput rates because of process variances in manufacturing. A new e-book from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains the defects caused by process…

ASSET white paper explores solutions for diminishing test coverage from in-circuit test (ICT) systems

Wednesday, December 19, 2012

Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the…

ASSET ScanWorks’ two FPGA-based instruments for testing on-board memory named Best in Test finalists

Thursday, December 13, 2012

FPGA-controlled test (FCT) tool for ScanWorks inserts, configures and executes IJTAG board test instruments from functional FPGAs Two new instruments for ASSET® InterTech’s ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World in its 2013 Best in Test awards program. ASSET’s instrumentation intellectual property (IP) supports…

New white paper reveals shrinking eye diagrams and signal integrity problems on high-speed buses

Tuesday, November 27, 2012

Bandwidth tests often detect degraded performance on DDR, PCI Express, Intel QPI, USB and others high-speed buses Richardson, TX – A new white paper from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, points out how increasing bus speeds on circuit boards could create havoc for…

Integrating ASSET's ScanWorks with Linear Technology's LTpowerPlay

Tuesday, October 23, 2012

Linear Technology and ASSET collaborate to bring boundary-scan tools to power management devices Richardson, TX, and Milpitas, CA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Linear Technology Corp. (www.linear.com) have collaborated to combine the programming and configuration capabilities of Linear Technology’s LTpowerPlay™ software with…

New tutorial explains how IJTAG standard streamlines chip validation and characterization

Sunday, September 23, 2012

IEEE P1687 IJTAG standard simplifies and automates management of embedded on-chip instruments. Richardson, TX (August 23, 2012) – A new introductory tutorial from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains how the new IEEE P1687 Internal JTAG (IJTAG) standard simplifies and automates the way chip…

ASSET integrates ScanWorks with Teradyne's PXI Express instruments

Monday, September 10, 2012

Richardson, TX, and North Reading, MA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Teradyne (www.teradyne.com), the leading supplier of automatic test equipment (ATE), have extended the integration of the JTAG and boundary-scan test capabilities of ASSET’s ScanWorks® platform for embedded instruments into Teradyne’s…

Press Releases