Press Releases

With the introduction today of Intel® Silicon View Technology (Intel® SVT), ASSET® InterTech’s ScanWorks® platform for embedded instruments becomes the only platform in the industry that fully supports all three aspects of the new validation, debug and test capabilities which Intel is embedding into its processors and chipsets.  Based…
Richardson, TX (February 12, 2013) – High-speed serdes (serializer/deserializer) links on printed circuit boards (PCB) sometimes don’t achieve their expected throughput rates because of process variances in manufacturing. A new e-book from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains the defects caused by process…
Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the…
FPGA-controlled test (FCT) tool for ScanWorks inserts, configures and executes IJTAG board test instruments from functional FPGAs Two new instruments for ASSET® InterTech’s ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World in its 2013 Best in Test awards program. ASSET’s instrumentation intellectual property (IP) supports…
Linear Technology and ASSET collaborate to bring boundary-scan tools to power management devices  Richardson, TX, and Milpitas, CA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Linear Technology Corp. (www.linear.com) have collaborated to combine the programming and configuration capabilities of Linear Technology’s LTpowerPlay™ software with…