Press Releases

ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, has issued a new eBook on how to test DDR memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. A recent survey of engineers by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory soldered to circuit…
Arium’s Intel® and ARM® hardware-assisted debug tools will be integrated into ASSET’s ScanWorks® platform for debug, validation and test ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, today acquired the business of Arium (www.arium.com), an Irvine, California provider of software debug tools for systems based on Intel®…
Richardson, TX (February 12, 2013) – High-speed serdes (serializer/deserializer) links on printed circuit boards (PCB) sometimes don’t achieve their expected throughput rates because of process variances in manufacturing. A new e-book from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains the defects caused by process…
Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the…