Press Releases

Richardson, TX (February 12, 2013) – High-speed serdes (serializer/deserializer) links on printed circuit boards (PCB) sometimes don’t achieve their expected throughput rates because of process variances in manufacturing. A new e-book from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains the defects caused by process…
Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the…
FPGA-controlled test (FCT) tool for ScanWorks inserts, configures and executes IJTAG board test instruments from functional FPGAs Two new instruments for ASSET® InterTech’s ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World in its 2013 Best in Test awards program. ASSET’s instrumentation intellectual property (IP) supports…
Linear Technology and ASSET collaborate to bring boundary-scan tools to power management devices  Richardson, TX, and Milpitas, CA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Linear Technology Corp. (www.linear.com) have collaborated to combine the programming and configuration capabilities of Linear Technology’s LTpowerPlay™ software with…
IEEE P1687 IJTAG standard simplifies and automates management of embedded on-chip instruments. Richardson, TX (August 23, 2012) – A new introductory tutorial from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, explains how the new IEEE P1687 Internal JTAG (IJTAG) standard simplifies and automates the way chip…
Richardson, TX, and North Reading, MA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Teradyne (www.teradyne.com), the leading supplier of automatic test equipment (ATE), have extended the integration of the JTAG and boundary-scan test capabilities of ASSET’s ScanWorks® platform for embedded instruments into Teradyne’s…
Instruments for ScanWorks FPGA-controlled test (FCT) perform DDR2, DDR3 and generic memory tests at maximum speeds Richardson, TX (August 7, 2012) – ASSET® InterTech has added two new memory test instruments to its ScanWorks® embedded instrumentation library for its FPGA-controlled test (FCT) circuit board test tool, giving electronics manufacturers…