ScanWorks Board Functional Test & Device Programming

Without probes or bed-of-nails fixtures, ScanWorks Memory Access Verify (MAV) and Component action for DDR4’s Connectivity Test (CT) can pinpoint shorts and opens on DDR4 device interconnects Downloadable DDR4 device models enable fast deployment of MAV test actions For even greater fault coverage, processor-based tests provide the added valueโ€ฆ
In development, ScanWorks automates complex DDR tuning to optimize memory performance In manufacturing, faster flash programming with ScanWorks enhances throughput In repair, ScanWorks’ automated functional test at processor speeds finds the toughest faults quickly Faster test and programming tools from ASSET® InterTech will accelerate development and production cycles forโ€ฆ
In development, ScanWorks automates complex DDR tuning to optimize memory performance In manufacturing, faster flash programming with ScanWorks enhances throughput In repair, ScanWorks’ automated functional test at processor speeds finds the toughest faults quickly Faster test and programming tools from ASSET® InterTech will accelerate development and production cycles forโ€ฆ