Manufacturing Test Archives | Page 5 of 6

ASSET's new modeling methodology extends non-intrusive JTAG/boundary-scan test coverage

Thursday, September 8, 2011

Richardson, TX& – A new model-based test methodology for ASSET® InterTech’s ScanWorks® platform for embedded instruments extends non-intrusive boundary-scan (JTAG) test coverage to devices that previously could not be tested or programmed with boundary scan. ASSET is the leading supplier of tools for embedded instrumentation. With the new modeling…

First embedded debugger for Intel x86 platforms can diagnose systems remotely

Wednesday, March 30, 2011

Richardson, TX (March 30, 2011) – A new embedded debugger from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, is the first debugger that can be embedded into Intel® x86 platforms for remote or local diagnostics. Based on ASSET’s ScanWorks® platform for embedded instruments, the debugger…

ASSET ScanWorks is first test tool for Intel's new 2nd generation Core i3, i5 and i7 processors

Tuesday, February 15, 2011

Richardson, TX – The ScanWorks® platform for embedded instruments from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, is the first validation and test platform to support Intel®’s new second generation Core™ processors (formerly codenamed Sandy Bridge). Manufacturers are able to perform structural and functional tests…

Frost & Sullivan recognizes ASSET for its competitive strategy innovation for ScanWorks platform

Tuesday, November 30, 2010

Richardson, TX – The ScanWorks® platform for embedded instruments from ASSET® InterTech has received a 2010 Global Competitive Strategy Innovation of the Year Award from Frost & Sullivan, a global research and consulting firm. ASSET (www.asset-intertech.com) is the leading supplier of open tools for embedded instrumentation. Every year Frost…

ASSET enhances boundary-scan test capabilities on ScanWorks Platform for Embedded Instruments

Tuesday, August 31, 2010

Richardson, TX – ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has enhanced the boundary-scan test capabilities of its ScanWorks® platform for embedded instruments by adding several powerful and automated test development and debugging features that accelerate the generation of boundary-scan tests. The ScanWorks boundary-scan…

ASSET and IPextreme collaborate to enable ScanWorks as an IEEE 1149.7 test solution

Wednesday, July 14, 2010

Richardson, TX – ASSET® InterTech, Inc., the leading supplier of open tools for embedded Instrumentation, will integrate test adapter intellectual property (IP) from IPextreme into its ScanWorks® platform for embedded instruments to enable chip and circuit board tests under the new IEEE 1149.7 reduced-pin boundary scan standard. “IPextreme leads…

ScanWorks platform for embedded instruments named finalist for EDN's Innovation Award.

Wednesday, February 24, 2010

Richardson, TX – The ScanWorks® platform for embedded instruments from ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has been named a finalist in EDN magazine’s annual Innovation Awards program. Glenn Woppman, ASSET’s CEO and president, was named a finalist for Innovator of the Year…

ASSET notches two more Best in Test finalist awards from Test & Measurement World magazine

Wednesday, January 6, 2010

Richardson, TX – ASSET® InterTech continued to be recognized for technical achievement as two products were named Best in Test 2010 finalists in Test & Measurement World magazine’s annual awards program. ASSET (www.asset-intertech.com) is the leading supplier of open tools for embedded instrumentation. Two instances of the ScanWorks® platform for embedded…

ASSET's new interposer opens test access to Intel Xeon processors 5500 series and Core i7 processors

Tuesday, September 22, 2009

Richardson, TX – With ASSET® InterTech’s new LGA1366 interposer, design, test and field repair engineers are able to access the debug port on the Intel® Xeon® Processor 5500 Series and Core™ i7 processors, which are based on Intel’s new Nehalem microarchitecture, after the processors have been placed on a…

Cray selects ASSET's ScanWorks platform for embedded diagnostics in next-generation supercomputers

Wednesday, August 19, 2009

Richardson, TX – Supercomputer leader Cray Inc. has selected ASSET® InterTech’s ScanWorks® platform for embedded instrumentation as the basis for embedded test solutions critical to Cray’s next-generation supercomputers. ASSET (www.asset-intertech.com) is the leading supplier of open tools for embedded instrumentation for design validation, test and debug. Cray will collaborate…

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