Manufacturing Test

Richardson, TX – Historically, verifying the at-speed functionality of serial interfaces on prototype circuit boards has required the system’s functional software. But the functional software is often not ready yet when prototypes arrive. That means delaying the product’s migration into manufacturing. A new eBook published by ASSET® InterTech describes…

Designers and manufacturing engineers face challenges when it comes to programming flash and EEPROM memories that are already soldered to a circuit board. Often, the software or firmware content of these memories has not yet been completed when hardware prototypes are being validated and tested prior to volume manufacturing.…

ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, has issued a new eBook on how to test DDR memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. A recent survey of engineers by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory soldered to circuit…

A new eBook from ASSET explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during circuit board production. Devices such as temperature sensors, electrical sensors and…

With the new PXI-based controller for ASSET® InterTech’s ScanWorks® platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different test technology. Operating from a personal computer and a PXI chassis, the new ScanWorks PXI-1000 controller can apply boundary-scan tests…

Non-intrusive software-based test methods deliver test coverage beyond the reach of legacy probes and bed-of-nails testers. A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-based non-intrusive methodologies that test from the…