Richardson, TX – ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has enhanced the boundary-scan test capabilities of its ScanWorks® platform for embedded instruments by adding several powerful and automated test development and debugging features that accelerate the generation of boundary-scan tests.
The ScanWorks boundary-scan test toolkit, which is based on the IEEE 1149.x boundary-scan standard (JTAG), is one of several non-intrusive validation, test and debug technologies that run on the ScanWorks platform. Other ScanWorks toolkits employ built-in self-test (BIST) technology to validate high-speed serial input/output (HSIO) buses and processor-controlled test (PCT) technology to validate the functionality and test the structural integrity of circuit boards within a manufacturer’s design and assembly operations.
“Diagnosing a scan path fault during integrity testing is usually easy, but when the scan path breaks during an interconnect test, things get complicated,” said Kent Zetterberg, ASSET’s product manager for boundary scan. “Now, ScanWorks automatically diagnoses these problems when they occur and points out immediately what driver on the board caused the problem. This saves tremendous time during test development and accelerates a product’s time-to-market. Run and fail information is also provided immediately for fast and precise failure resolution during board bring-up and debug.”
Another new ScanWorks boundary-scan feature speeds up test development by identifying for the test developer the non-boundary-scan devices connected to boundary-scan nets on a circuit board. Then the test engineer can import device models from ASSET’s online library of over 11,000 models with just a few mouse clicks. Instead of the time-consuming task of manually editing text files of device models, the ready-to-use models from ASSET’s online library can be integrated into tests instantaneously.
Other new enhancements include a simplified process for merging multiple netlists and a faster method for integrating ScanWorks into other software packages. The new netlist merging feature automates this aspect of test development and still allows the user to exclude netlists from ScanWorks’ comprehensive fault coverage reports. And integrating ScanWorks into distinct test executives or other programs is now a simple selection option in the ScanWorks application programming interface (API).
ScanWorks® – Platform for Embedded Instruments
ASSET, through its ScanWorks platform, is applying the experience it has gained from two decades as a leading supplier of IEEE 1149.1 boundary-scan (JTAG) test tools to the development of open embedded instrumentation tools. The boundary-scan infrastructure that is embedded into chips and circuit boards is one of several technologies which can form the basis for an embedded instrumentation toolset. In recent years, ASSET has significantly enhanced ScanWorks beyond boundary-scan test with the addition of other embedded instrumentation technologies, including processor-controlled test (PCT) and tools for Intel® IBIST (Interconnect Built-In Self Test), an embedded instrumentation technology that Intel® and other companies are embedding into next-generation chips and chipsets.
About ASSET InterTech
ASSET InterTech is the leading supplier of open tools for embedded instrumentation for design validation, test and debug. The ScanWorks platform provides automation, access and analysis tools in one environment. Users can quickly and easily validate and test semiconductors, circuit boards or entire systems during every phase of a product’s life, including design, manufacturing/repair and field maintenance. ASSET InterTech is located at 2201 North Central Expressway, Suite 105, Richardson, TX 75080.
For product information, call 888-694-6250, fax 972-437-2826, e-mail email@example.com or visit www.asset-intertech.com.
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