All the tools you need to debug and trace ARM® and Intel® embedded applications in one place.
Quickly validate both hardware/firmware interactions and operating margins in your design.
Verify, test and characterize SoCs, FPGAs and ASICs pre- and post-tapeout.
Non-intrusive test technologies to maximize test coverage and diagnostics.
JTAG is the underlying technology used in boundary-scan test (BST), that is used for manufacturing defect detection and diagnosis.Normally...
This revised version of the eBook now has real examples of the three programming methods that can be used along with the actual programming...
In the paper, faults are inserted on an Intel® Shark Bay platform, and the ScanWorks® Processor-Controlled Test product is used...
Testing platforms designed with Intel® Architectures (IA) can be extremely difficult. Some developers reuse the production BIOS to...
Testing platforms designed with Intel® Architectures (IA) can be extremely difficult and testing memories near impossible. If you are still...
