With embedded JTAG-based run-control, information about difficult-to-reproduce failures in the field can be captured for analysis.
ScanWorks Embedded Diagnostics (SED) is a custom embedded ITP implementation that provides on target run-control via the Baseboard Management Controller (BMC) for target applications that require 5 nines or 6 nines reliability. In these applications, a failure must be analyzed without the actual plugging in of an ITP JTAG probe. This requirement implies that the software is already resident on the target and that an external processor (BMC) has the ability to conduct forensics on the hung server processor. Intel has implemented the ability for a crashed/hung processor to keep valuable postmortem information available within the CPU.
The purpose of SED is to allow the customer to run CScripts from a remote host connected to the failing server to extract this data prior to system reset.
As each server design and requirements are unique, SED is customized to meet the target constraints to accomplish the goal of data extraction.
With embedded PCT, information about difficult-to-reproduce failures in the field can be captured for analysis.
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.