Boards and chips keep getting denser, faster. And the speed is higher so they’re a whole lot more sensitive. Slight variances or defects cause intermittent crashes and performance degradation. And the negative effects interact. Welcome to living “on the edge.”
A new class of test and detection technologies based on on-chip embedded instruments has emerged which is a generation better in finding the defects and variances in memories and high-speed serial IO.
In our latest tutorial on diagnosing boards, you’ll get a deep inside look at the effects of defects and variances in the complex designs of today.