Detection and Diagnosis of Printed Circuit Board Defects and Variances

Boards and chips keep getting denser, faster. And the speed is higher so they’re a whole lot more sensitive. Slight variances or defects cause intermittent crashes and performance degradation. And the negative effects interact. Welcome to living “on the edge.”

A new class of test and detection technologies based on on-chip embedded instruments has emerged which is a generation better in finding the defects and variances in memories and high-speed serial IO.

In our latest tutorial on diagnosing boards, you’ll get a deep inside look at the effects of defects and variances in the complex designs of today.

Tutorial Content:

  • Board and chip defects and variances
  • The cumulative effect
  • Testing memory and serial IO
  • On-chip detection technologies
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