Defect Coverage | Non-intrusive Board Test
For the last 30 years or more, the electronics industry has mostly relied on a hands-on approach to test and measurement. Older board test technologies and external instrumentation include in-circuit test (ICT), manufacturing defect analysis (MDA), flying probe, oscilloscopes, logic analyzers and others.
These methods depend on physical (probe) contact to test PCBs, i.e intrusive board test. Beginning more than 10 years ago and accelerating over the last few years, non-intrusive board test (NBT) methods incorporating embedded instrumentation have taken on greater importance. Recent developments in electronic technology, fueled by economics drivers, are requiring the ’soft access’ approach of NBT, including boundary-scan test, processor-controlled test (PCT) and built-in self test (BIST).
Learn all about non-intrusive board test directly from Adam Ley, Chief Technologist at ASSET InterTech, provider of the soft access ScanWorks platform for board debug, validation and test.
NBT Defect Coverage Whitepaper:
- The Emergence of Non-intrusive Test
- Defects and the Defect Universe
- The PCOLA/SOQ/FAM Fault Spectrum
- Grading NBT, a Case Study