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Solving the Problem of Diminishing Test Coverage from In-Circuit Test (ICT)

In-circuit test (ICT) seemed ideal for simplifying test generation and execution when it was first introduced. But device package changes, device complexity, board layout density and increased circuit speeds have eroded usability and test coverage of ICT ever since. Many advances have been made to keep ICT relevant, but those advances haven’t kept pace with the erosion of test access.

Fortunately, new test access standards and software-driven tools offer alternatives to probe-based testing.