Platform Validation Using Intel® Interconnect Built-in Self Test | IBIST

This paper describes the empirical results of platform validation using Intel® Interconnect Built-In Self Test (IBIST) and the ScanWorks HSIO product. Among the experiments conducted were:

  • Bit Error Rate (BER) testing on Intel QuickPath Interconnect (QPI)
  • Effect of equalization settings on system margins
  • Eye diagram variations based upon different silicon
  • Static patterns versus Linear Feedback Shift Register (LFSR) pseudo-random patterns
  • Effect of margin point dwell times
  • Margin degradations due to concurrent I/O testing
  • Compare/contrast HSIO/IBIST tests with oscilloscope results

The advantages of Intel IBIST technology versus oscilloscopes are highlighted. It is shown that system margins are highly dependent upon the on-board silicon, as well as the stress patterns, dwell time, and concurrent stress on a device.

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