Webinar recording: Squeezing Out More Test Coverage: Bridging the Gap Between Boundary Scan and Functional Test
All test engineers want to increase board test coverage. That last ounce can mean the difference between great product quality, and a lot of dissatisfied customers returning your product for repair. Non-boundary scan devices, such as memory devices, ADCs, Ethernet PHY, etc. can be functionally tested with boundary scan using a mechanism named Component Action (CA).
This webinar describes the CA methodology, reviews its programming model, and demonstrates examples on a live target.