Every Test Engineer looks for ways to increase the overall test coverage on their designs.
That last ounce of test coverage can mean the difference between a market perception of great quality and dissatisfied customers returning your product for repair.
Traditionally, non-boundary scan devices on printed circuit boards need special handling at a functional test station, as they elude classic interconnect short- and open-circuit testing. However, using boundary scan as a stimulus, such components – such as memory devices, analog-to-digital converters, ethernet PHYs, etc. – can in fact be functionally tested using a mechanism called Component Action.
Our upcoming webinar, to be held on Tuesday, August 31st, 2021 at 10:30am Central Time and presented by ASSET’s Michael R. Johnson, will describe the Component Action methodology, provide an in-depth view of the programming model, and demonstrate examples on a live target.
To register for the webinar, click here.