Four products within the ASSET ScanWorks platform for embedded instruments are named Best in Test finalists

Richardson, TX (Nov. 15, 2011) – Four new products for ASSET® InterTech's ScanWorks® platform for embedded instruments have been named finalists by Test & Measurement World magazine for its 2012 Best in Test awards. ASSET ( is the leading supplier of tools for embedded instrumentation.

"It always a tremendous achievement to be named a finalist for a Best in Test award," said Glenn Woppman, ASSET's president and CEO. "But having four new products nominated in the same year tells me that we've been able to tap into the needs of the industry moving forward. Because ScanWorks is a software-based platform, we are able to quickly respond to emerging validation, test and debug requirements with new and advanced innovations."

The four ScanWorks Best in Test finalists are:

  • ScanWorks High-Speed I/O (HSIO) for Intel Architecture (IA) – The ScanWorks HSIO for IA is a new validation toolkit for Intel's Core™ Processors codenamed Haswell that achieves and in some respects exceeds many of the goals of an oscilloscope, but with a new non-intrusive methodology. ScanWorks HSIO validates signal integrity at the PHY level on high-speed I/O buses without the physical probes of traditional oscilloscopes. This is crucial on Haswell designs because HSIOs with speeds in excess of 5 Gbps are super-sensitive to capacitive coupling and this often invalidates a traditional oscilloscope's test results. ScanWorks HSIO is a non-intrusive, software-based tool that employs the embedded instrumentation IP embedded in Intel's chips for validation and test (Intel IBIST). 
  • ScanWorks FPGA-Controlled Test (FCT) – ScanWorks FCT is the first product to automatically insert multiple instruments in an FPGA, configure and connect these instruments as a cohesive board-tester-in-a-chip, and operate this tester from an intuitive drag-and-drop interface. The FPGA host of ScanWorks FCT need not be dedicated to test. FCT can be inserted in a functional device and removed when it is no longer needed. For example, a ScanWorks FCT board tester might be inserted in an FPGA, used to bring up early prototypes and then removed. Later, it might be inserted and removed again if it is needed for volume manufacturing test. 
  • ScanWorks IJTAG-DL – ScanWorks IJTAG-DL (Developers License) is the first and only toolkit for the development of debug and verification routines based on the new IEEE P1687 Internal JTAG (IJTAG) standard and intended for system-on-a-chip (SoC) and other complex devices. The IJTAG standard will enable a new generation of embedded debug and verification methods for complex chips. The standard specifies an access architecture and protocol for test and measurement instruments that are embedded in silicon. The ScanWorks IJTAG-DL toolkit allows engineers to manage, access and automate embedded on-chip instruments, and analyze their outputs. The IJTAG-based tests generated by ScanWorks are portable so they can be re-used to test boards and systems in prototype bring-up, manufacturing and field service. 
  • ScanWorks Boundary-Scan Test (BST) in Teradyne Di-Series Instruments – The ScanWorks Boundary-Scan Test (BST) for Teradyne Di-Series Instruments is a software product that brings sophisticated boundary-scan (JTAG) test and device programming capabilities to Teradyne Di-Series instruments, which are frequently deployed in large-scale military/aerospace ATE systems such as the Teradyne Spectrum 9100 and Lockheed Martin LM-STAR". No ScanWorks hardware is needed. The ScanWorks tools are able to test circuit boards and program on-board devices through the high-speed communications channels on a Di-Series instrument. By re-using the Di-Series hardware as a host for ScanWorks BST, card slots in the ATE system are freed up for other test functionality.

About ASSET InterTech

ASSET InterTech is the leading supplier of tools for embedded instrumentation for design validation, test and debug. The ScanWorks platform provides automation, access and analysis tools in one environment. Users can quickly and easily validate and test semiconductors, circuit boards or entire systems during every phase of a product's life, including design, manufacturing/repair and field maintenance. ASSET InterTech is located at 2201 North Central Expressway, Suite 105, Richardson, TX 75080.

Trademarks: ASSET, the ASSET logo and ScanWorks are registered trademarks of ASSET InterTech, Inc. All other trade and service marks are the properties of their respective owners.