Designing sufficient operating margins into today’s high-speed printed circuit boards has become a very tough job. Especially challenging are those high-speed serial I/O and DDR3|DDR4 memory buses.... more
Remember test pads? Small contact points on a board’s interconnect buses with physical access for test purposes? No more. Or at least not for high-speed serial interconnects like PCI Express, Fibre... more
Ever wonder why your notebook is running slower than ever, or keeps hanging and crashing? It could be signal integrity.
Fortunately, Intel® Interconnect Built-In Self Test (IBIST) technology now... more
Validating prototype circuit boards gives you a level of confidence, but variances in manufacturing processes are just as likely to erode that confidence right along with the transfer speeds on high-... more
This document provides an overview of the use of boundary-scan test, processor-controlled test and high-speed I/O validation when applied to the Intel® microarchitecutre code name Haswell design.... more
One of the most pressing problems for system manufacturers is testing memory and memory buses on circuit boards. The speeds are simply too high, and signals get easily distorted when touched by... more
Performing signal integrity validation with traditional high-end capital equipment such as oscilloscopes is a very expensive proposition. Fortunately, Intel Interconnect Built-In Self Test (IBIST)... more