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Manufacturing Test

Memory Fault Insertion and Detection of Intel 4th Generation Core Family

Memory Fault Insertion and Detection of Intel 4th Generation Core Family

In the paper, faults are inserted on an Intel® Shark Bay platform, and the ScanWorks® Processor-Controlled Test product is used to detect a myriad of faults. Real life examples always... more
Increasing Test Coverage on Current Intel Platforms

Increasing Test Coverage on Current Intel Platforms

Testing platforms designed with Intel® Architectures (IA) can be extremely difficult. Some developers reuse the production BIOS to configure the platform for test, to simplify the task with good... more
Testing Memories without BIOS on the Latest Intel® Platforms

Testing Memories without BIOS on the Latest Intel® Platforms

Testing platforms designed with Intel® Architectures (IA) can be extremely difficult and testing memories near impossible. If you are still using a production BIOS to configure your memory subsystem... more
Faster Flash Programming via FPGA and IJTAG

Faster Flash Programming via FPGA and IJTAG

With tremendous growth in capacity, programming NOR and NAND flash memories at full functional speed is a must. But how? Here are the ins and outs on using an onboard FPGA and IJTAG, the IEEE 1687... more
Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

What happens when you’re mixing multiple embedded TAPs – eTAPs? Like when TAPs for IEEE 1149.1 boundary scan, JTAG software debug ports (ARM DAP, Intel ITP) and IJTAG instruments are all in the same... more
JTAG Diagnostics for Intel QPI Structural Defects

JTAG Diagnostics for Intel QPI Structural Defects

For circuit board manufacturers, a self-healing bus like Intel® QPI can be self-defeating. Especially when it comes to board quality and diagnosing structural defects. Functional tests will typically... more
I2C Interface Test With FPGA IP and JTAG

I2C Interface Test With FPGA IP and JTAG

A circuit board doesn’t have to be operational for functional tests to be applied to its I2C (Inter-Integrated Circuit) interfaces. What you need is 3 things: on-board 1149.1 JTAG, an FPGA and some... more
JTAG | IJTAG Semiconductor and Board Test Security

JTAG | IJTAG Semiconductor and Board Test Security

Without security, what do we expect the hackers to do? Face the facts: There are no industry standards for semiconductor and board test security. None in the JTAG and IJTAG standards. So all the... more
SPI Flash/EEPROM Programming Using FPGA and JTAG

SPI Flash/EEPROM Programming Using FPGA and JTAG

A ScanWorksx® Platform Application Brief Onboard SPI Flash memory can be programmed effectively via either of two methods: Through the boundary-scan chain of a connected FPGA Using a SPI master IP... more
Fast Flash Parallel In-System Programming | ISP | JTAG

Fast Flash Parallel In-System Programming | ISP | JTAG

In-system programming (ISP) of memories within the manufacturing flow is well established. However, the industry has taken a step backward to off-line device programming because the increasing size... more
Serial Port Functional Test | FPGA UART IP | JTAG

Serial Port Functional Test | FPGA UART IP | JTAG

How do you verify the hardware functionality of serial communication interfaces on a new board, such as UART, SPI, I2C, before the system’s functional software has been completed? The... more
Detection and Diagnosis of Printed Circuit Board Defects and Variances

Detection and Diagnosis of Printed Circuit Board Defects and Variances

Boards and chips keep getting denser, faster. And the speed is higher so they’re a whole lot more sensitive. Slight variances or defects cause intermittent crashes and performance degradation. And... more
System Test | Gateway Scan Bridge | Boundary Scan JTAG

System Test | Gateway Scan Bridge | Boundary Scan JTAG

Did you know that you can leverage the work you’ve already done developing boundary-scan board tests into system test? Why re-invent the wheels when you’ve already got them? Are the boards... more
Testing System Clocks with an FPGA and JTAG | Boundary Scan

Testing System Clocks with an FPGA and JTAG | Boundary Scan

System clocks are fundamental for booting prototype boards or PCBs in production. Faulty clocks create havoc for any functional circuitry like processors, chipsets, ASICs and FPGAs. Even the... more
At-speed SPI Flash/EEPROM Programming using FPGA and JTAG

At-speed SPI Flash/EEPROM Programming using FPGA and JTAG

With the size of memory exploding – especially flash and EEPROM – the problems are: how to program it quickly and after it’s already soldered onto the board. And, of course, you don’t want to take a... more
Testing DDR3 Memory with Boundary Scan/JTAG | eBook

Testing DDR3 Memory with Boundary Scan/JTAG | eBook

A recent survey asked test engineers to identify their biggest circuit board test problems. Among the top three answers were characterizing and testing soldered-down memories! Clearly, the ability to... more
IEEE 1149.6 Tutorial | Testing AC-coupled and Differential High-speed Nets

IEEE 1149.6 Tutorial | Testing AC-coupled and Differential High-speed Nets

In recent years, the sheer number of advanced digital networks on circuit boards has grown exponentially. These chip-to-chip interconnects, which are largely comprised of AC-coupled and/or... more
How to Debug Dead Boards in Production | Case Study | eBook

How to Debug Dead Boards in Production | Case Study | eBook

Cost goes up. Complexity goes up. Speed goes up. But time to debug boards goes down. Something’s gotta give, or at least change. The answer is taking advantage of the processor's JTAG debug port to... more
Defect Coverage | Non-intrusive Board Test

Defect Coverage | Non-intrusive Board Test

For the last 30 years or more, the electronics industry has mostly relied on a hands-on approach to test and measurement. Older board test technologies and external instrumentation include in-circuit... more
Functional Test on I2C and SPI | System Monitors with JTAG

Functional Test on I2C and SPI | System Monitors with JTAG

Many electronic systems feature a wide range of system monitoring devices. The task is keeping track of certain conditions or operating parameters, like temperature while the system performs its... more
IEEE 1149.7 JTAG Tutorial | eBook

IEEE 1149.7 JTAG Tutorial | eBook

Learn what IEEE 1149.7 is all about, what its objectives are, how it works, its implications for debugging SoCs and 3D chips, and for testing circuit boards. Several illustrations show IEEE 1149.7... more
SVF | Serial Vector Format Specification JTAG | Boundary Scan

SVF | Serial Vector Format Specification JTAG | Boundary Scan

Serial Vector Format (SVF) is a file format consisting of boundary scan vectors to be sent to a device under test so that such information can be exchanged among various tools. Originally... more
Cache-as-RAM to Bring up Non-Booting Boards

Cache-as-RAM to Bring up Non-Booting Boards

What’s a designer to do when faced with a catch-22? How to diagnose and debug prototype circuit boards that will not boot the bare metal firmware or have no BIOS at all? But without some software,... more
Solving the Problem of Diminishing Test Coverage from In-Circuit Test (ICT)

Solving the Problem of Diminishing Test Coverage from In-Circuit Test (ICT)

In-circuit test (ICT) seemed ideal for simplifying test generation and execution when it was first introduced. But device package changes, device complexity, board layout density and increased... more
How To Test High-Speed Memory With Non-Intrusive Embedded Instruments

How To Test High-Speed Memory With Non-Intrusive Embedded Instruments

One of the most pressing problems for system manufacturers is testing memory and memory buses on circuit boards. The speeds are simply too high, and signals get easily distorted when touched by... more
IEEE 1149.1 JTAG and Boundary Scan Tutorial

IEEE 1149.1 JTAG and Boundary Scan Tutorial

JTAG was originally developed to solve board interconnect test problems and has evolved into a widespread and generic soft access test mechanism for chips, boards and systems. Examples includes... more
Board Bring-Up | Software Tools Ensure Fast Prototype Bring-Up

Board Bring-Up | Software Tools Ensure Fast Prototype Bring-Up

Bringing up prototype circuit boards is a tipping point in the product development cycle. Unfortunately, it too often becomes a tripping point. Boards that won’t come up can derail the project... more
FPGA-Controlled Test (FCT): What it is and why is it needed?

FPGA-Controlled Test (FCT): What it is and why is it needed?

An FCT whitepaper by Al Crouch, Chief Technologist at ASSET InterTech and Co-Chairman of the IEEE P1687 IJTAG Standard Working Group. The precedent for embedding test and measurement instrumentation... more
Embedded Diagnostics for Highly Available Systems

Embedded Diagnostics for Highly Available Systems

This paper begins with an executive summary of embedded diagnostics, followed by an introduction to the 9's concept for highly-available systems, and then documents a number of case studies. It... more