Board Assisted-BIST


Scope: To define or identify embedded instruments to be included within chips that can be used to recover lost test coverage or to enhance the board test process. Modern boards are losing test points, and boundary scan is ineffective for high-speed data interfaces (DDR, PCIe, G-bit Enet, etc.)
and this lost coverage must be replaced by test features included within chips. BA-BIST is an attempt by INEMI to stipulate to chip-providers what features need to be supported and to push for open and standardized access and descriptions of these instruments.

You've got it; re-use it

Many tests created for validating and debugging new designs never get re-used in manufacturing, due to tool differences, test time, difficulty of access, or poor communication between engineers.  New standards and techniques may bridge these gaps.

CPU & FPGA Support

ScanWorks supports Intel®, ARM®, Freescale™,
& other CPUs; Altera® and Xilinx® FPGAs.

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