IEEE 1687


Internal JTAG


Scope: Architecture and methodology for access to embedded test and debug features via the IEEE 1149.1 Test Access Port (TAP). The proposed standard includes hardware architecture rules, description language for
the access network, and description language for the embedded instrument operations. IEEE 1687 is also called IJTAG where the I = Internal.

BIST access and reuse

Once adopted, IEEE 1687 will bridge structural test and functional test like nothing before it.  Improving on the vision the original JTAG committee once had for the INTEST instruction, IEEE 1687 will make chip-level at-speed functional tests controllable and accessible via the TAP, using tools like the ScanWorks Platform for Embedded Instruments. 

IEEE Site: http://grouper.ieee.org/groups/1687/

ASSET Participant: Al Crouch

Current Status: The standard is approved.

Upcoming Events of Interest:
  • IJTAG Technical Workshop Series presented by ASSET InterTech and Mentor Graphics. Sign-up here.
  • ITC 2015 – International Test Conference (Anaheim, October 6-8, 2015)

Articles of Interest:

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