IEEE P1687


Internal JTAG


Scope: Architecture and methodology for access to embedded test and debug features via the IEEE P1149.1 Test Access Port (TAP). The proposed standard includes hardware architecture rules, description language for
the access network, and description language for the embedded instrument operations. P1687 is also called IJTAG where the I = Internal.

BIST access and reuse

Once adopted, IEEE 1687 will make chip-level instruments controllable and accessible via the TAP, using tools like the ScanWorks Platform for Embedded Instruments. 

IEEE Site: http://grouper.ieee.org/groups/1687/

ASSET Participant: Al Crouch

Current Status: See the grouper link above.

Upcoming Events of Interest:
ITC 2013 – International Test Conference (Anaheim, September 10-12, 2013)

Articles of Interest:

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