- JTAG/Boundary-Scan board debug, validation and test
- Unified platform workflow
- Automated test development
- Massive parallel test and programming
- Fast DDR memory interface test
- Flexible licensing | Online libraries
Here’s your chance to see how easy it is to validate and test chips and circuit boards with the ScanWorks® platform’s Boundary-Scan Test (JTAG) and Internal JTAG (IJTAG) Test tools. ScanWorks’ automated, model-based test development will slash the time you spend developing tests. And then you’ll be able to re-use the same tests in manufacturing to save more time!
How about high-speed flash programming? Or FPGA-based test engines? Structural board test or functional at-speed tests on prototypes or production boards? The ScanWorks platform can do it all. We call it: Soft Access to Hard Data.
Demo: Your major application areas/test challenges - Length: 15-30 min