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Arranged by category – Software Debug, Chip Debug, Hardware Validation, Manufacturing Test and Videos – these are some of our trending eBooks and videos. But there’s more, much more. Our experts are constantly working on new resources to help you. Click on the “More” buttons in each category to take a deeper dive.

Manufacturing Test

Accelerate your Xilinx Zynq UltraScale+ designs with PFx

Accelerate your Xilinx Zynq UltraScale+ designs with PFx

This guide will take the reader step by step through the setup and testing of the Xilinx Zynq UltraScale+ UltraZed target using the ScanWorks® PFx products. The ScanWorks PFx products include... more
Cut DDR tuning and test development efforts in half on i.MX 6-based designs

Cut DDR tuning and test development efforts in half on i.MX 6-based designs

Embedded software tuning on an SoC for DDR memories is the next evolution in technology and it is available today. The technology should not only provide the ability for automatic DDR calibration... more
Cut your DDR tuning efforts in half on Zynq-7000 based designs

Cut your DDR tuning efforts in half on Zynq-7000 based designs

Embedded software tuning on a SoC for DDR memories is the next evolution in technology and it is available today. The technology should not only provide the ability for automatic DDR calibration... more
Learn how to accelerate your NXP i.MX6 designs with PFx

Learn how to accelerate your NXP i.MX6 designs with PFx

This guide will take the reader step by step through the setup and testing of the SABRE Lite board using the ScanWorks PFx products. The ScanWorks PFx products include three distinct tools focus at... more

Software Debug

UEFI Framework Debugging | SourcePoint - Updated Version, November 2018!!

UEFI Framework Debugging | SourcePoint - Updated Version, November 2018!!

Spending too much time trying to navigate the growing UEFI code base or debugging UEFI code after you have inserted your module? The UEFI code base is growing to take advantages of the latest... more
Guide to Intel Debug and Trace

Guide to Intel Debug and Trace

One of the industry’s leaders in x86 Debug and Trace technologies, Larry Traylor, has written the ultimate guide for UEFI and platform validation engineers. Full of helpful tips and techniques... more
The MinnowBoard Chronicles

The MinnowBoard Chronicles

Open-source hardware, firmware and software and a 15-month diary of explorations into x86 Architecture, UEFI, debug & trace, Yocto Linux, and other topics.Avid blogger Alan Sguigna recorded his... more
Intel Trace Hub | Faster Software Debug | Finding Root Cause

Intel Trace Hub | Faster Software Debug | Finding Root Cause

Intel®’s Trace Hub has arrived in the nick of time for faster software debug. Code bases, including UEFI firmware, have gotten so large and so complex that just navigating through... more

Chip Debug

IJTAG vs JTAG vs IEEE 1500 ECT | Technical Tutorial - Second Edition

IJTAG vs JTAG vs IEEE 1500 ECT | Technical Tutorial - Second Edition

Technology changes over time. Along the way, industry standards must change to keep up with technology. It should come as no surprise that since 1990, when the IEEE 1149.1 Boundary-Scan Standard (... more
IEEE 1687 IJTAG | The Future of Embedded Instruments

IEEE 1687 IJTAG | The Future of Embedded Instruments

Accessing and operating embedded instrument IP has not been easy. In fact, it’s been a challenge. But the recently ratified IEEE 1687 Internal JTAG (IJTAG) standard for embedded instruments is... more
Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

What happens when you’re mixing multiple embedded TAPs – eTAPs? Like when TAPs for IEEE 1149.1 boundary scan, JTAG software debug ports (ARM DAP, Intel ITP) and IJTAG instruments are all in the same... more
IJTAG vs JTAG vs IEEE 1500 ECT | Introduction Tutorial

IJTAG vs JTAG vs IEEE 1500 ECT | Introduction Tutorial

Why so many standards? For instance, why IJTAG, JTAG and 1500 ECT for embedded instruments? The answer is simple: standards overlap because technology overlaps. This eBook tutorial – the first in our... more

Hardware Validation

Data Mining Analytics for Serdes | HSIO Validation

Data Mining Analytics for Serdes | HSIO Validation

One-shot pass/fail validation testing won’t quantify the risk of faults on serdes and high-speed I/O (HSIO) buses, but data mining with statistical analytic tools will. In fact, you’ll... more
System Marginality Validation DDR Memory and Serial I/O

System Marginality Validation DDR Memory and Serial I/O

Designing sufficient operating margins into today’s high-speed printed circuit boards has become a very tough job. Especially challenging are those high-speed serial I/O and DDR3|DDR4 memory buses.... more
Detection and Diagnosis of Printed Circuit Board Defects and Variances

Detection and Diagnosis of Printed Circuit Board Defects and Variances

Boards and chips keep getting denser, faster. And the speed is higher so they’re a whole lot more sensitive. Slight variances or defects cause intermittent crashes and performance degradation. And... more
High-Speed Non-Intrusive Board Test | PCIe, QPI

High-Speed Non-Intrusive Board Test | PCIe, QPI

Remember test pads? Small contact points on a board’s interconnect buses with physical access for test purposes? No more. Or at least not for high-speed serial interconnects like PCI Express, Fibre... more