eResources

Google search

Arranged by category – Software Debug, Chip Debug, Hardware Validation, Manufacturing Test and Videos – these are some of our trending eBooks and videos. But there’s more, much more. Our experts are constantly working on new resources to help you. Click on the “More” buttons in each category to take a deeper dive.

Manufacturing Test

Boundary-Scan Test Using ScanWorks with Teradyne's High Speed Subsystem

PXIe-based test systems fill an important role in satisfying functional ATE test requirements for digital, analog, and RF interfaces on defense and avionics applications. Teradyne’s PXIe-based... more

Embedded JTAG for Boundary-Scan Test

JTAG is the underlying technology used in boundary-scan test (BST), that is used for manufacturing defect detection and diagnosis.Normally, BST is used in benchtop environments, either as a... more

At-speed SPI Flash Programming using FPGA and JTAG - Revised

This revised version of the eBook now has real examples of the three programming methods that can be used along with the actual programming performance.With the memory file size increasing –... more

Memory Fault Insertion and Detection of Intel 4th Generation Core Family

In the paper, faults are inserted on an Intel® Shark Bay platform, and the ScanWorks® Processor-Controlled Test product is used to detect a myriad of faults. Real life examples... more

View More Manufacturing Test eBooks

Software Debug

The MinnowBoard Chronicles

Open-source hardware, firmware and software and a 15-month diary of explorations into x86 Architecture, UEFI, debug & trace, Yocto Linux, and other topics.Avid blogger Alan Sguigna recorded his... more

Intel Trace Hub | Faster Software Debug | Finding Root Cause

Intel®’s Trace Hub has arrived in the nick of time for faster software debug. Code bases, including UEFI firmware, have gotten so large and so complex that just navigating through... more

UEFI Framework Debugging | SourcePoint

Spending too much time trying to navigate the growing UEFI code base or debugging UEFI code after you have inserted your module?UEFI code base is growing to take advantages of the latest silicon... more

Hardware-Assisted Debug and Trace within the Silicon

Software debug has changed dramatically and for the better, especially with Intel’s introduction of new trace IP in its silicon and ARM’s enhanced trace macrocells. Legacy debug methods with printf... more

View More Software Debug eBooks

Chip Debug

IJTAG vs JTAG vs IEEE 1500 ECT | Technical Tutorial - Second Edition

Technology changes over time. Along the way, industry standards must change to keep up with technology. It should come as no surprise that since 1990, when the IEEE 1149.1 Boundary-Scan Standard (... more

IEEE 1687 IJTAG | The Future of Embedded Instruments

Accessing and operating embedded instrument IP has not been easy. In fact, it’s been a challenge. But the recently ratified IEEE 1687 Internal JTAG (IJTAG) standard for embedded instruments is... more

Mixing Embedded eTAPs | 1149.1, IJTAG, Software Debug

What happens when you’re mixing multiple embedded TAPs – eTAPs? Like when TAPs for IEEE 1149.1 boundary scan, JTAG software debug ports (ARM DAP, Intel ITP) and IJTAG instruments are all in the same... more

IJTAG vs JTAG vs IEEE 1500 ECT | Introduction Tutorial

Why so many standards? For instance, why IJTAG, JTAG and 1500 ECT for embedded instruments? The answer is simple: standards overlap because technology overlaps. This eBook tutorial – the first in our... more

View More Chip Debug eBooks

Hardware Validation