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Press Releases

ASSET ScanWorks is among the first tools to support the new on-chip Intel Silicon View Technology

Mon, June 3, 2013
With the introduction today of Intel® Silicon View Technology (Intel® SVT), ASSET® InterTech’s ScanWorks® platform for embedded instruments becomes the only platform in the industry that fully... read more

How to do functional tests on I2C and SPI monitors with JTAG is explored in new eBook from ASSET InterTech

Wed, May 8, 2013
A new eBook from ASSET explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during... read more

New PXI controller for ASSET’s ScanWorks platform supports four test technologies

Tue, April 23, 2013
With the new PXI-based controller for ASSET® InterTech’s ScanWorks® platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different... read more

ASSET enhances IJTAG embedded instrumentation tool for debugging systems-on-a-chip (SoC) and testing circuit boards

Wed, March 27, 2013
Improvements to the graphical viewer and significantly faster performance are among the enhancements to ASSET® InterTech’s ScanWorks® IJTAG Test tool, with which engineers are able to access, control... read more

New eBook explores CPU cache-as-RAM for board bring-up of non-booting prototype circuit boards

Tue, February 26, 2013
A new e-book from ASSET® InterTech takes a close look at how run-control tools can employ a processor’s on-chip cache memory instead of on-board RAM memory to boot non-booting prototype circuit... read more

New eBook explores how manufacturing process variances affect throughput on high-speed serdes

Tue, February 12, 2013
High-speed serdes (serializer/deserializer) links on printed circuit boards (PCB) sometimes don’t achieve their expected throughput rates because of process variances in manufacturing. A new e-book... read more

ASSET white paper explores solutions for diminishing test coverage from in-circuit test (ICT) systems

Wed, December 19, 2012
A new white paper from ASSET® InterTech explains why test coverage from intrusive, probe-based in-circuit testers with their bed-of-nails fixtures is diminishing. The paper also describes software-... read more

ASSET ScanWorks’ two FPGA-based instruments for testing on-board memory named Best in Test finalists

Thu, December 13, 2012
Two new instruments for ASSET® InterTech’s ScanWorks® platform for embedded instruments have been named finalists by Test... read more

New white paper reveals shrinking eye diagrams and signal integrity problems on high-speed buses

Tue, November 27, 2012
A new white paper from ASSET® InterTech points out how increasing bus speeds on circuit boards could create havoc for signal integrity on those buses, in turn degrading the bus’ throughput... read more