ScanWorks® Platform for Embedded Instruments

Processor-Controlled Test (PCT) Technologies

Processor-controlled test (PCT) makes use of a circuit board’s boundary-scan infrastructure to access the on-board processor via its JTAG port, Intel® Debug Port (ITP) or other debug ports. Control of the processor is temporarily given over to the PCT system so that tests can be applied at processor speeds through the input/output pins that connect devices on the circuit board to the processor. In this way, PCT propagates test patterns through the processor onto the structural interconnects of the circuit board. PCT can exercise the functionality of the circuit board as well as detect and diagnose structural faults.

When deployed in concert with other non-intrusive validation and test technologies, such as I/O instrumentation, boundary-scan test and core instrumentation, chips, boards and systems can be thoroughly and cost-effectively validated, tested and debugged.

Watch the short "PCT Overview" and "PCT Demo" movies for a rapid understanding of the benefits and features of PCT.

For a complete overview of PCT, click here.

PCT can be effectively deployed across a wide range of applications. Click on any of the following for more information.

• Debugging Intel boards
• Dead board diagnosis
• Fast functional test
• Fast flash programming
• Guided fault isolation

PCT white papers and other documents are available here.

For more information on any of the other technologies supported by the ScanWorks platform, click one of the following links:

• Boundary-Scan Test (JTAG)
• I/O Instrumentation
• Core Instrumentation

Find out how much additional coverage and insight Processor-Controlled Test will provide on your own board designs.