ScanWorks® Platform for Embedded Instruments

Non-intrusive Board Test (NBT)

Non-intrusive board test (NBT) is a software-driven methodology that applies a number of contemporary non-intrusive, probe-less technologies to validate and test circuit boards during prototype debug, volume manufacturing and repair. The ScanWorks® NBT solution is a flexible combination of several technologies, including boundary-scan test, processor-controlled test (PCT) and/or I/O instrumentation’s Intel® Interconnect Built-in Self Test (IBIST). NBT provides validation and test coverage where older intrusive test technologies like in-circuit test (ICT), flying probe test and manufacturing defect analyzers (MDA) are lagging because the physical access they rely upon is disappearing.

Resources:

White Paper: “Economics, Technology Drive Industry to Non-intrusive Board Test”

White Paper: “Non-intrusive Board Test Strategies for the Intel® Xeon® Processor 5500 Series”

White Paper: “Defect Coverage for Non-intrusive Board Tests”

“Testing and Validating Intel® Xeon® 5500 / Core i7 (Nehalem) Platforms”
This video shows how the ScanWorks® Platform for Embedded Instruments and non-intrusive board test (NBT) deals with validation and test of boards that carry the Intel® Xeon® Processor 5500 Series.

Presentation: “EMC converges test onto ScanWorks® Platform”
Test re-use, high coverage, low capital expense and faster time-to-market are just some of the reasons Jeff Moore from EMC gave in his presentation at the recent Board Test Workshop for EMC's shift away from intrusive test methods to the non-intrusive embedded instrumentation technologies of the ScanWorks platform.

Check out these other ScanWorks solutions:

• Embedded Diagnostics
• Memory Test

Ask us how Non-intrusive Board Test could overcome your test and measurement problems.