ScanWorks® High-Speed I/O Validation Solutions

Memory Validation and Test

ScanWorks can apply several of its technologies and tools, as well as third-party modules, to validate and test memory connections. I/O Instrumentation tools for the Intel® IBIST technology can validate the signal integrity of memory connections. ScanWorks Boundary-Scan Test can verify structural integrity and Processor-Controlled Test (PCT) can detect at-speed defects without an operating BIOS or OS.

According to iNEMI, over 80% of engineers working with memory have bring-up or testing problems. They say that connectivity test of external memory devices is a “crisis in waiting” as memory devices get larger and faster. The primary reasons for this are:

• Loss of standard test point access due to circuit density and signal integrity concerns
• Memory signal/speed timing requirements exceed capability of test equipment
• No “test mode” designed into memory devices to allow easy, straightforward generation of a structural test

ScanWorks non-intrusive validation and test strategies can help.

Boundary-Scan Test can initially verify structural integrity (no shorts or open circuits). Loopback cards can be used for DIMMs where memories are not scannable.

Processor-Controlled Test solutions will supplement boundary scan by providing a fast functional test for at-speed defects. It also provides structural-level test coverage.

I/O Instrumentation solutions for Intel IBIST technology will detect signal integrity problems caused by problematic design, or manufacturing defects and variances.

Future standards such as IEEE P1581 and IEEE P1687 will provide additional on-chip instruments for memory structural test and built-in self test. The access and control frameworks within these standards will allow much greater diagnosability and repairability of on-chip and on-board memories.

Resources:

Fact Sheet: JTAG DDR3 DIMM Module by Reach Technology, Inc.

Fact Sheet: ScanWorks® Intel® IBIST Xeon 5600 DDR3 testing

Connect newsletter article: “New solutions added to ScanWorks platform to validate and test DDR3 memory interconnects”

Check out these other ScanWorks solutions:

• Non-intrusive Board Test (NBT)
• Embedded Diagnostics

Contact us for more information on the ScanWorks® solutions for Memory Testing.