ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, auto­mation and analysis of embedded instrumentation.

ScanWorks® Solutions

Non-intrusive Board Test (NBT)

Embedded Diagnostics

Memory Test

ScanWorks® Platform for Embedded Instruments

Embedded Diagnostics

 

Embedded Diagnostics

Many computer and communications systems today demand high-availability, 24/7, 365 days a year. And systems designers constantly search for ways to reduce the No Trouble Found (NTF) problem caused by intermittent field failures which cannot be diagnosed in the lab. Consequently, equipment manufacturers must consider how to optimize the reliability of their systems. ScanWorks diagnostic intellectual property (IP) can be embedded into high-availability systems to determine the root cause of software and hardware failures. With embedded access to a board’s CPU debug port, designers can:

  • Get access to all architecturally visible registers in a multi-processor or multi-board system
  • Dump internal information from a processor hang
  • Set internal CPU breakpoints
  • Single-step through processor instructions
  • Dump processor and chip configuration, registers and memories
  • Run processor, memory, and I/O channel diagnostics

Resources:

Technical Overview: “ScanWorks Embedded Diagnostics

White Paper: “Embedded Diagnostics for Highly Available Systems

Check out these other ScanWorks solutions:

Ask us how ScanWorks® Embedded Diagnostics could benefit your products.

 

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