ScanWorks® Platform for Embedded Instruments

Embedded Diagnostics

Many computer and communications systems today demand high-availability, 24/7, 365 days a year. And systems designers constantly search for ways to reduce the No Trouble Found (NTF) problem caused by intermittent field failures which cannot be diagnosed in the lab. Consequently, equipment manufacturers must consider how to optimize the reliability of their systems. ScanWorks diagnostic intellectual property (IP) can be embedded into high-availability systems to determine the root cause of software and hardware failures. With embedded access to a board’s CPU debug port, designers can:

• Get access to all architecturally visible registers in a multi-processor or multi-board system
• Dump internal information from a processor hang
• Set internal CPU breakpoints
• Single-step through processor instructions
• Dump processor and chip configuration, registers and memories
• Run processor, memory, and I/O channel diagnostics

Resources:

Technical Overview: “ScanWorks Embedded Diagnostics”

White Paper: “Embedded Diagnostics for Highly Available Systems”

Check out these other ScanWorks solutions:

• Non-intrusive Board Test (NBT)
• Memory Test

Ask us how ScanWorks® Embedded Diagnostics could benefit your products.