ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

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 ScanWorks® Intel® IBIST

Intel® IBIST Toolkit for the ScanWorks® Platform

Employing traditional validation and test techniques on serial buses with data transfer speeds climbing well above 1 gigabits-per-second (Gbps) is expensive, difficult and often ineffective. Fortunately, non-intrusive validation techniques like those of the ScanWorks® embedded instrumentation platform offer solutions.

The Intel® IBIST (Interconnect Built-In Self Test) toolkit for ScanWorks makes it the only design validation, test and debug platform to support Intel's IBIST next-generation embedded instrumentation technology. Intel is embedding IBIST into its chips and chipsets like Nehalem and others to give designers tools to more effectively validate the high-speed serial buses in its advanced system architecture and platform technology, QuickPath Interconnect (QPI), which is replacing the Front Side Bus (FSB) in advanced systems.

The IBIST QPI Toolkit for ScanWorks is a turnkey validation solution containing software and hardware, customization services, training and product support. The tools in the kit include:

  • Pattern Generation and Checking
  • Bit Error Rate (BER) Testing
  • Margining

The many benefits of the ScanWorks platform over traditional validation technologies include:

  • Reduced validation costs
  • Shorter validation times
  • Faster time-to-market for new designs
  • Robust validation routines
  • Thorough validation by stressing all bus lanes simultaneously

Click here to contact an ASSET representative for more information.

Resources

A number of resources are available to explain and offer greater detail on ScanWorks® and Intel's® QPI architecture.

Fact Sheet on the IBIST QPI Toolkit for ScanWorks
Intel®'s QuickPath Interconnect (QPI)
Press release
Intel® IBIST article

"Platform Validation Using Intel® Interconnect Built-In Self Test (Intel® IBIST)" - Technical paper presented at DesignCon 2009. Register to receive a copy.

 

Related Links:

ScanWorks for High-Speed Buses - Fact Sheet
ScanWorks with IEEE 1149.6 Testing - Fact Sheet
ScanWorks Named "Best In Test 2005"

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