National Semiconductor — SCANSTA476 Evaluation Kit

This evaluation kit demonstrates a simple implementation of the SCANSTA476 device, it allows the user to exercise the device operation and make simple measurements.

The SCANSTA476 is a low-power, mixed signal device that uses the IEEE 1149.1 (JTAG) interface to access as many as eight analog/mixed signal input channels. Each of the eight multiplexed input channels is selectable for sampling via an instruction loaded to the JTAG Test Access Port (TAP). The analog value of the selected input is converted to a 12-bit digital value and stored in a JTAG TAP register. The resulting measurement may be scanned out of the register thru the JTAG TAP.

ASSET InterTech has developed a fully comprehensive test project that makes voltage measurements on Analog input ports A0, A1 and A2. It does this using a Script action that reads the 12 bit digital value via an internal boundary scan register for each analog input and then converts the HEX value into a decimal value and displays the measured voltages. A Scan Path Verify action is included as well.

To receive the ScanWorks Project for the SCANSTA476 Evaluation Kit, please register with us and we will send you the project. Register Here.