ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

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Boundary Scan Resources

Processor-Controlled Test Resources

ScanWorks® Intel® IBIST Resources

Semiconductor Evaluation and Demonstration Boards Supported by ScanWorks®

The ScanWorks JTAG environment supports integrated circuit devices that comply with the boundary-scan standard. This includes various devices that have been developed to perform specific boundary-scan functions, such as gateway devices for multiple scan paths and other types of components from vendors such as Texas Instruments, National Semiconductor, Firecron and others.

Below is a list of evaluation or demonstration boards produced and sold by semiconductor vendors to support their specific devices. ASSET InterTech has created tests to exercise these devices and boards using our ScanWorks software. If you have our ScanWorks software, you will be able to take these projects and import them directly into your system to have a fully tested project for the evaluation or demo board.

National Semiconductor

National Semiconductor — SCANSTA476 Evaluation Kit

This evaluation kit demonstrates a simple implementation of the SCANSTA476 device, it allows the user to exercise the device operation and make simple measurements.

ScanSTA476

The SCANSTA476 is a low-power, mixed signal device that uses the IEEE 1149.1 (JTAG) interface to access as many as eight analog/mixed signal input channels. Each of the eight multiplexed input channels is selectable for sampling via an instruction loaded to the JTAG Test Access Port (TAP). The analog value of the selected input is converted to a 12-bit digital value and stored in a JTAG TAP register. The resulting measurement may be scanned out of the register thru the JTAG TAP.

ASSET InterTech has developed a fully comprehensive test project that makes voltage measurements on Analog input ports A0, A1 and A2. It does this using a Script action that reads the 12 bit digital value via an internal boundary scan register for each analog input and then converts the HEX value into a decimal value and displays the measured voltages. A Scan Path Verify action is included as well.

To receive the ScanWorks Project for the SCANSTA476 Evaluation Kit, please register with us and we will send you the project. Register Here.

 

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