ASSET's Connect Newsletter

Connect Sep 2011

Wed, 21 Sep 2011 14:29:15 GMT

Articles in this edition of Connect include:

FPGA-controlled test – The newest evolution of embedded instrumentation!
White paper on FPGA-controlled test: How it works & its benefits
A new and easier way to validate Intel® Haswell designs
Combining multiple technologies to solve today's challenges
Modeling technique extends coverage further to more non-boundary scan devices
ASSET and Teradyne team up on large-scale mil/aero testers
ScanWorks validates PCI Express performance for add-in cards
New tech papers from ASSET experts hit the streets
Blog posts tackle hot topics – board bring-up, lane training failures, I/O circuit drift…

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Tue, 24 May 2011 13:23:13 GMT

Articles in this edition of Connect include:

The reasons for having a platform for embedded instruments
The power of HSIO BIST for board validation, test and debug
Ways to overcome in-circuit test (ICT) redundancy
Combining multiple technologies to solve today's challenges
Ircona, Dublin use ScanWorks to validate high-speed bus designs
First embedded debugger for X86 platforms
ScanWorks wins award from Frost & Sullivan
ScanWorks offers first toolkit for IEEE 1687 IJTAG
Intel®-enabled, advanced tool now available for validating 2nd generation, 22nm Intel® Core™ high-speed buses
New IEEE P1838 being defined for 3D chip testing
ASSET partners with Flextronics to accelerate IEEE 1687 adoption

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Tue, 19 Oct 2010 05:51:50 GMT

Articles in this edition of Connect include:

Emerging IJTAG standard marks a new chapter in embedded instrumentation
Overcoming probe-based validation and test inadequacies
New boundary-scan features speed test development
ASSET/Intel validation toolkit for DDR3 memory suppliers
Optimizing service processors in high-availability systems
ASSET/Test & Measurement World webinar on non-intrusive board test (NBT) online now
Ratification of IEEE P1687 IJTAG standard
IEEE 1149.7 reduced-pin boundary scan gets a boost from ASSET/IPextreme collaboration

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Tue, 01 Jun 2010 14:33:18 GMT

Articles in this edition of Connect include:

Test is a value center, not a cost center.
Next generation Processor-Controlled Test.
IEEE 1149.7 and P1689 - dispelling the misconceptions.
ScanWorks® delivers the test coverage that ICT can't.
Testing DDR3 memory interconnects.
Validation and test of boards carrying latest Intel® Xeon® and Itanium® processors.
Whitepaper: Embedded diagnostics are critical to high-availability systems.

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Mon, 22 Feb 2010 11:41:54 GMT

Articles in this edition of Connect include:

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Wed, 28 Oct 2009 11:07:53 GMT

Articles in this edition of Connect include:

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Thu, 01 May 2003 11:07:53 GMT

This index page lists all previous Connect Newsletters and their contents.