This paper describes platform validation using Intel® Interconnect Built In Self Test (IBIST). IBIST utilizes the embedded instrumentation technology present on high-end chipsets. The paper concentrates on testing multiple links of a high-speed serial bus in a single system. It will show validation differences between traditional methods using an oscilloscope and a third-party test methodology. These differences include test coverage, test time, and eye capture results.

Stephanie graduated from Pacific Lutheran University in 1999; double majoring in electrical engineering and computer engineering. She worked for Intel Corporation for seven years before taking a position with ASSET InterTech, Inc. as an application engineer.