ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, auto­mation and analysis of embedded instrumentation.

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Processor-Controlled Test (PCT) can be used at all stages of a board's life cycle -
from development through to mass production and field returns.

Processor-Controlled Test Development Station

Processor-Controlled Test's Development Station includes an Interactive mode of operation. This Interactive mode is useful in board development debug and New Product Introduction. Reads and writes can be made from and to any device registers at any location in the board's memory map. Bus tests, memory tests and dumps, flash programming, probe stimulus and many other tools are provided. There is also a BIOS Trace tool for boards driven by Intel® Pentium® processor families.

Processor-Controlled Test Manufacturing Station

Processor-Controlled Test's Manufacturing Station includes an Operator mode. In Operator mode, PCT functional and structural testing is fully automated. Test results can be either PASS/FAIL or with full diagnostics. Test times are short, which means that in-line testing does not impact the line's beat rate.

Processor-Controlled Test Diagnostic & Repair Station

Processor-Controlled Test is the ultimate tool for board debug and field return repairs. Even with boards that fail to boot, are no problem for PCT to diagnose. The built-in Guided Fault Isolation interface gives extensive guidance to operators and repair technicians. This whitepaper shows how dead boards are debugged.

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